> Optical metrology

Optical metrology

VEW develops and manufactures optical measuring devices that can be used to collect and analyze surface data of the measurement objects. In addition, VEW offers measuring services as well as the high-resolution calibration of optically imaging systems with a specially developed sight-beam calibration.

  • 3D-CAM Fringe Projection System

    3D-Cam

    The VEW 3D-Camera allows for the topographic measurement of object
    surfaces by the projection of structured light. 

  • Stereo Fringe Projection Systems

    Stereo-Cam

    The VEW Stereo-Cam allows for 3D-measuring of any freeform surfaces.

  • In-Line Quality Control

    In-Line Quality Control

    The VEW measurement systems can be individual adapted for integration in a production line.

    The measurement software “Fringe Processor” has an interface, which allows for controlling the measurement procedure with a superior system. The data can be delivered as raw data,...

  • Zebra Deflectometry System

    Zebra Deflectometry System

    The measurement principle of deflectometry is based on the reflection of regular geometrical pattern on the object´s surface which is under inspection.

    The shape of the object´s surface leads to a distortion of the reflected pattern. The distortion is detected using a...

  • Surface Analyzer

    The measurement principle of deflectometry is based on the reflection of regular geometrical pattern on the object´s surface which is under inspection.

    The shape of the object´s surface leads to a distortion of the reflected pattern. The distortion is detected using a...

  • Golden Eye

    The shearography principle allows for non destructive testing of compound materials (Glare, CFK, GFK). It can detect hidden defects under the surface using a dynamic or thermal load of the structure under investigation.

    Hidden defects like delaminations, cracks, debondings,...

  • Vision Ray Calibration / Automatic Calibration Unit

    Vision Ray Calibration

    Vision ray calibration is a new method which measures the vision ray for each pixel of e.g. a camera. The advantage of this method is that no description of the optical system with the help of polynoms is necessary. This allows for calibration of extrem optics and of...