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VEW DZL-01 RED  
Technical Data Input voltage nom. 110V DC, range: +66...110V...+160V Output voltage nom. 24V DC, galvanically isolated Output current max. 2A Interference voltage at IA 2A Product Information The VEW redesign of the DZL-01 power supply unit can be used instead of the original module plug-and-play in the specified application. The VEW DZL-01 RED provides a power of max. 50VA, with a nominal input voltage of 110V DC, galvanically isolated from the output voltage of 24V DC, max. 2A. The VEW DZL-01 RED complies with the railway standard IEC571-EN50155. The structure is available in 2 versions: 1. open-frame, chassis mounting, without front panel      Connector: Metrimate-6 Amphenol      Construction height: <30mm 2. 19 "3HE plug-in module, with front panel 6TE or 8TE, Siemens      Connector: DIN 41612 H15      Measuring sockets: Uout      Operation LED: green UA      Operation LED: red Uin The redesign has been optimized by a factor of 5 compared to the original module with regard to the interference voltage level at the output. Datasheet VEW DZL-01 RED  
LWL 1000 coupler  
Technical data Electronic-optical coupler, DIN 41612 F32 low profile to 8 IR-transmitter and 8 IR-receiver Standard: without cover, adapter, 1000 MPF 8 transmitter micro lens for 2,2mm apertur to standard 1000 MPF Transferrate 10MBd at 650nm 8 receiver open collector, 2,2mm apertur to standard 1000 MPF Transferrate 5Mbit/s at 650nm Wiring Standard 17x AWG26-70mm, optional other length *All product and service marks contained herein are the trademarks or service marks of their respective owners. Product information For electrically decoupled and interference-free transmission of control signals between drive control units and power units of light rail vehicles, optical fibres and couplers from 8 transmitters and 8 IR-receivers are being used. The original modules 463 124.9380 by manufacturer Siemens had been joined by a suscep-tible flex printed circuit. The redesign of the couplers is made of a low profile DIN 41612 female multi point connector with special mounting on row z and d as well as the construction form F, 2 multilayer circuit boards, which are robustly connected with each other by 70mm AWG26 single wires. Other connection lengths can be manufactured optionally. Both multilayers carry the DIN 41612 female multipoint connector and also the optic coupler, with the arrangement of 8 receivers and 8 transmitters for standard 1000 micron plastic fibre (MPF). The optical modules are combined in a grey plastic carrier as an "optical coupler", on which an adapter for the connection with 16 optical fibres can be screwed on. The optical fibres lock in adapter B by a snap-in-connection and this way can be separated in the given arrangement from coupler A "in one piece". Alternatively, customer-specific assembled adapters with each 8 firmly moulded MPF by different colours for "receiver-" and "transmitter-" lines can be delivered. Length of MPF according to specifications. Individual wire designation. The couplers can be mounted into an Intermas connector housing for the construction type DIN 41612 F upon request so the female multi point connector can provide electric contacting on the one hand and the adapter with the 16 optical fibres on the coupler can maintain and secure the coupling of the IR-signals on the other hand. The 16 optical fibres are led out the connector housing strain-relieved with an according cable support sleeve. Datasheet Coupler LWL 1000 R-T-8 (MPF) RED  
DZL-01_english.pdf  
VEW DZL-01 RED Redesign Power suppy 110//24V 2A for railway applications The VEW redesign of the DZL-01 power supply unit can be used instead of the original module plug-and-play in the specified application. The VEW DZL-01 RED provides a power of max. 50VA, with a nominal input voltage of 110V DC, galvanically isolated from the output voltage of 24V DC, max. 2A. The VEW DZL-01 RED complies with the railway standard IEC571-EN50155. The structure is available in 2 versions: 1. open-frame, chassis mounting, without front panel Connector: Metrimate-6 Amphenol Construction height: <30mm 2. 19 "3HE plug-in module, with front panel 6TE or 8TE, Siemens Connector: DIN 41612 H15 Measuring sockets: Uout Operation LED: green UA Operation LED: red Uin The redesign has been optimized by a factor of 5 compared to the original module with regard to the interference voltage level at the output. Option 2, front panel 6TE 3HE Option 2: 41612 H15 Option 1: Metrimate 6 Technical data: Input voltage Output voltage Output current Interference voltage Option 1 Connector Option 2 Connector Front panel LEDs Dimensions : nom. 110V DC, range: +66...110V...+160V : nom. 24V DC, galvanically isolated : max. 2A : at IA 2A <=200mV ss : open-frame, without front panel : Amphenol, Metrimate 6 : 19" 3HE plug-in assembly : DIN 41612 H15 : Siemens (6TE or 8TE) : Vin red Vout green. : Europe-format 100x160mm, height <30mm DIE ENTWICKLER VEW Vereinigte Elektronikwerkstätten GmbH Edisonstraße 19 * Pob: 330543 * 28357 Bremen Fon:(+49) 0421/271530 Fax(+49) 0421/273608 E-Mail: VEW-GmbH-Bremen@t-online.de  
Door relay board  
Product information The original assemblies of the door relay panel G340B-E44010-A8138-S22 for Siemens-Duewag railways are no longer manufactured by the original manufacturer. A completely pin- and function-compatible redesign of the assembly is available, which can be exchanged for the original assembly plug-and-play. All switching, locking and memory functions have been redeveloped with modern, highly reliable comb relays, which are mounted on locked sockets. The interface was implemented with the original Siemens 33-pin connector RP300 on the transom. Delivery with individual test report. Additional delivery guarantee: 10 years VEW Door relay board G340B-E44010-A8138-S22 RED  
Zebra Deflectometry System  
Product Information Defelectometry measuring method in use for surface measuring systems An introduction to the possible applications The measurement principle of deflectometry is based on the reflection of regular geometrical pattern on the object´s surface which is under inspection. The shape of the object´s surface leads to a distortion of the reflected pattern. The distortion is detected using a camera. The resulting measurement data are the local surface angle. The data can be used to calculate the surface gradients, local curvature or the 3D-shape of the object. The main part of the setup is a LCD-monitor, which is used as coordinate area. Different image pattern with regular fringes are displayed and captured with the help of a camera. The advantages of this measurement principle are as follows: High resolution (nanometer-scale); robust against environmental disturbances like vibrations – hence usually no optical table is needed. For special applications an additional confocal distance sensor can be integrated, leading to an absolute precision of the object´s shape of up to 100nm (depending on the size of the measurement area) The system includes an intuitively operable user interface. The user can acquire directly the relevant data of an optical surface, for ex. Dioptre or the extraction of profiles   Applications The system can be adapted to special applications: Measurement of optical components (lenses, eye glasses, concave mirrors,…) Measurement of mirrors for solar power plants Surface inspection of injection moulding parts (quality control) Measurement of micro parts Zebra Deflectometry System  
Deflectrometry_based_Surface_Analyzer_System_english.pdf  
Vereinigte Elektronikwerkstätten GmbH Bremen Deflectometry based Surface Analyzer VEW - Vereinigte Elektronikwerkstätten GmbH Edisonstrasse 19, 28357 Bremen, Germany Tel: +49-421-271530 Fax: +49-421-273608 E-Mail: info@vew-gmbh.de © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 1 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen Content 1 2 3 4 5 6 7 Introduction ........................................................................................................................ 3 Advantage of the Technique............................................................................................... 3 Measurement Range, Resolution and Accuracy ................................................................ 4 Requirements of Measuring Environment ......................................................................... 5 Requirements of Object Surface......................................................................................... 5 Comparison with Interferometers & Tactile Profiler ......................................................... 6 Developed Measurement Systems...................................................................................... 7 7.1. Desk-top type ........................................................................................................... 7 7.2. Mobile type .............................................................................................................. 8 7.3. Floor-standing type ................................................................................................ 10 8 Application Examples ...................................................................................................... 11 8.1. Measurement of flat mirror (glass) ........................................................................ 11 8.2. Measurement of X-ray telescope mirror ................................................................ 12 8.3. Measurement of mandrel (metal) ........................................................................... 13 8.4. Measurement of free-form eye-glass lenses........................................................... 14 8.5. Spherical lens mold (Aluminum, diamond turned)................................................ 15 8.6. Measurement of milled / polished surface ............................................................. 16 8.7. Measurement of rivet holes on aircraft surface ...................................................... 17 8.8. Lacquer surface – frequency separation................................................................. 18 8.9. Other Applications ................................................................................................. 19 9 Development According to User Requirements ............................................................... 20 10 Technical Specifications .................................................................................................. 22 © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 2 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 1 Introduction The deflectometry system, or sometimes called as fringe reflection technique (FRT), is a highly sensitive, incoherent optical full-field gradient measurement technique for free-form specular surfaces of any material, such as aspherical lenses, polished metal & glass mirrors, automotive and aircraft lacquers, liquid surface, etc. It utilises the deformation and displacement of a regular fringe pattern after reflection from a test surface to infer the surface slopes and reconstructs the 3D shape of the object. Sinusoidal fringe pattern on monitor Camera Display Camera observed fringe patterns Free-form test surface Distorted virtual fringe pattern Reconstructed object shape. PV~602.39µm Figure 1: Measurement Principle. As shown in Figure 1, the deflectometry measuring system consists of a TFT display and a high resolution CCD camera. A straight sinusoidal fringe pattern generated by the computer is displayed on the monitor during measurement, and the camera acquires the fringe image reflected by the surface of the measured object. Any irregularities on the object give rise to a distortion of the observed fringes, which can be evaluated quantitatively with very low uncertainty by virtue of the phase-shifting technique. 2 Advantage of the Technique Ordinary optical non-contact three-dimensional measurement techniques, such as fringe projection, laser triangulation, etc., are ineffective for smooth surfaces. The deflectometry makes full use of the reflection of light by the measured object, which not only makes it possible to measure smooth surfaces, but also improves the measurement accuracy to the level of coherent optical measurements. Deflectometry is a surprisingly simple & reliable technique for white-light fringe analysis that is evolving from a defect-testing technique towards being useful in industrial metrology applications, including those as yet restricted to the domain of interferometry. The low costed deflectometry system has the similar measurement accuracy to the interferometer, but only uses an incoherent light source. The system does not require sophisticated mechanical scanning devices (such as scanning white light interferometer), it can be directly used to measure irregular free-form surfaces compared to general interferometers that can only © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 3 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen measure planar and spherical objects. Thanks to VEW's newly developed camera and system calibration techniques, high-precision curvature and three-dimensional coordinate distribution can be obtained. Compared with other ultra-high-accuracy tactile 3D coordinate measuring instruments, deflectometry has the advantages of high speed and large data volume, and can acquire millions of data points in a short time. 3 Measurement Range, Resolution and Accuracy By using different geometric parameters and hardware configurations, the lateral measurement range (coordinates X&Y) of the system covers from a few millimeters to about 500 millimeters depending on the radius of curvature (ROC) of the measured object. A plane surface being measured can not be larger than half of the screen size, but no such constraint exists in measuring of a concave surface. On the other hand, the measurable range of a convex surface will be much reduced when the ROC increasing. The measurement range varies with the curvature of the surface of the object. For surfaces with too large overall curvature, such as small diameter (<10mm) spheres, the camera will not see streaks on the display, which will reduce the measurement range. The X&Y coordinates resolution is mainly dependent on the pixel number and the opening angle of the camera. For a general application, the lateral coordinate’s resolution is about 0.1mm. Figure 2: Measurement range of the deflectometry. The effective measurement range is where the fringe can be observed on the surface of the object. Therefore, the measurement range is different on the surface with different curvature (i.e. bending degree). In the more interesting height direction (coordinate Z), another advantage of the deflectometry comes to bear here: its very high dynamic range. Whilst the height range of the surface amounts to almost ~10 mm, it is evident that surface imperfections of several nanometres can easily be resolved. In the past, the industry’s interest has been focussed mainly on the detection of defects and ripples because of its nm range sensitivity. On the other hand, attempts to reconstruct the absolute surface shape from the gradient map have been plagued by systematic errors that accumulate to unacceptable uncertainties during data integration. Recently, thanks to improved measurement and evaluation techniques, the state of the art in absolute surface measurement has reached a level of maturity that allows its practical usage in precision optical manufacturing and qualification systems. With the help of our optimized shape integration algorithm and system calibration technique, the accuracy of absolute shape measurement can archive to 50 nm in the 100x100 mm horizontal range for some surfaces, e.g. flat or trough mirrors. For an irregular free-form surface, the absolute measurement accuracy is typically better as 1 µm. Since the highest © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 4 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen accuracy is not always required, it is a viable strategy to select the simplest approach that will comply with the specifications. 4 Requirements of Measuring Environment Figure 3: On-line deflectometry measurement systems. Left: mounted at polishing machine in open space. Right: mounted in a clean room for X-ray telescope mirror manufacture. The deflectometry is a non-coherent optical measurement technique and has a low sensitivity to external mechanical vibration and other factors. It is robust enough to be mounted on the processing site, enabling an on-line measurement. A constant dark environment is generally required to facilitate the camera to obtain more accurate fringe images. However, there is no special requirement for a closed measurement space. 5 Requirements of Object Surface The surface of the measured object must have a certain specular reflection characteristics. The resolution and precision of the measurement decrease with the decrease of the specular reflectance, and the measurement time also needs to be extended accordingly. Diamond turned surface Large aspherical mirror Glass or plastic lens Measurable surface … Wood & plastic surface Liquid surface X-Ray mirror Precision machining surface Painted surface Figure 4: Requirements of object surface. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 5 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 6 Comparison with Interferometers & Tactile Profiler We have compared a test object by using a VEW deflectometry system, a Zygo interferometer, and a Tencor P15 high-accuracy contact type coordinate measuring machine. Here the object is an approximately planar metal mirror (Al + MgF2). VEW Deflectometry Zygo Interferometer Overall surface height distribution: The deflectometry measurement is the same as the interferometer measurement result, with a height difference of 20 μm. [20 µm] [20 µm] [15 nm] Microstructure of height distribution: Remove slowly changing height components. A slight bump structure (15 nm) above the mirror surface can be seen in the deflectometry measurement result, and the structure is completely submerged in the system noise (150 nm) in the interferometer measurement result. [150 nm] Microstructure of local height distribution: Consistent with the Tencor P15 highly sensitive profiler (measurement time up to 4 hours) measurement. [11 nm] [11 nm] Tencor P15 (0.1nm resolution). There are still traces of dust moving with the contact head in the measurement results. Figure 5: Comparison with Interferometers and highly sensitive profiler. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 6 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 7 Developed Measurement Systems In order to obtain the best measurement results, we always design the deflectometry system for the user's requirements. For objects with different size and curvature, the suitable measurement setup may be different. Here we only show some examples. 7.1. Desk-top type Figure 6: Desk-top type A. Main features of desk-top type A:  Field of view: 11080 mm;  Closed measurement space;  Two laser pointers for object positioning;  Controlled with external computer. Figure 7: Desk-top type B. Main features of desk-top type B:  Field of view: 11080 mm;  Closed measurement space with rotary sliding door;  Two laser pointers for object positioning;  Build-in control monitor. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 7 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen Figure 8: Desk-top type C. It is mounted in a clean room for X-ray telescope mirror manufacture. Main features of desk-top type C:  Field of view: 135115 mm;  Half-closed measurement space for object moving by robot;  High-resolution medicine grey-value display,  High precision confocal sensor for object positioning;  Using high precision hexapod for object movement;  Controlled with external computer. 7.2. Mobile type Figure 9: Mobile type A. It can be fixed onto the testing object, e.g. aircraft surface, by vacuum. Main features of mobile type A:  Field of view: 120100 mm;  Closed measurement space;  Two laser pointers for object positioning;  Vacuum adsorption system;  Controlled with external computer. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 8 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen Figure 10: Mobile type B. It can be fixed onto the testing surface by vacuum. Main features of mobile type B:  Field of view: 8060 mm;  Suitable for planar surface measurement: e.g. lacquer coating;  Measure defect, scratch, orange peel, waviness;  Closed measurement space;  Vacuum adsorption system;  Build-in computer and control monitor. Figure 11: Mobile type C. It can be fixed onto the testing surface by vacuum. Main features of mobile type C:  Field of view: 7555 mm;  Suitable for planar surface measurement: e.g. lacquer coating;  Measure defect, scratch, orange peel, waviness;  Closed measurement space;  Vacuum adsorption system;  Controlled with external computer. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 9 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 7.3. Floor-standing type Measurement site Solar condenser Height map: an overall parabolic shape. Microstructure oft he height map: irregular waviness. Figure 12: Floor-standing type A. The system has been used to measure solar condensers. Main features of floor-standing type A:  Half-closed measurement space;  Two laser pointers for object positioning;  Controlled with external computer. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 10 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8 Application Examples 8.1. Measurement of flat mirror (glass) a) Object of the flat mirror.  = 6 inch - b) Reconstructed shape which measured with vacuum pressure. PV~ 183nm = c) Reconstructed shape which measured without vacuum pressure, PV~ 140nm d) = b) – c). PV~ 267nm Figure 13: Measurement of flat glass mirror with the desk-top type C. In this application, we chose a thick plane mirror ( = 6 inch) as the measured object. In order to keep the object stable during the measurement, we apply a negative vacuum pressure behind the object. From the measurement results, it is found that although the plane mirror is thick (~28mm) the negative pressure behind it significantly changes the surface topography of the plane mirror. Such deformations (more than 200nm) will have a big impact in the manufacture of precision optical components. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 11 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.2. Measurement of X-ray telescope mirror a) Object of X-ray mirror c) Remaining microstructure of shape after best cone fit. PV~8.166 nm b) Reconstructed shape. PV~830.1µm d) Averaged curvature map of the surface Figure 14: Measurement of X-ray telescope mirror with the desk-top type C. In this application, we have measured an X-ray mirror which has an off-axis conical surface. The reconstructed shape is shown in Figure 14b). After a best cone fitting, the remaining shape is shown in Figure 14c). It can be seen in the figure that there is a pronounced bulge on the left and right sides of the mirror and some irregular stripe structure are visible in the middle. Differentiating the measured gradient data we can get the curvature distribution of the mirror surface, see 14d). Here we can clearly see the grating-like pattern caused by the special designed structures on the backside of the mirror. Some small spot defects can also be clearly observed both in Figure 14c) and 14d). © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 12 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.3. Measurement of mandrel (metal) a) Reconstructed PV~1051 µm b) Remaining microstructure of shape after best cone fit. PV~114 nm, RMS ~15.72 nm shape. c) Remaining gradient map in X direction after 2nd polynomial fitting. PV~180 µRad, RMS ~34.18µRad d) Remaining gradient map in Y direction after 2nd polynomial fitting. PV~80 µRad, RMS ~8.37µRad Figure 15: Measurement of metal mandrel with the desk-top type C. The mandrel is a tool for the X-ray telescope mirror manufacture. It has an off-axis conical surface. The measurement results show that the mandrel is indeed a conical surface. At one end the radius of curvature (ROC) is 276.877mm, at the other end the ROC is 277.568mm. We also found regular ripples on the surface, as shown in Figure 15b). The PV range of these ripple structures is very small (~114nm) and mainly distributed in the direction of Y. The gradient maps in X & Y clearly show this effect. These structures maybe produced during the manufacture of the mandrel. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 13 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.4. Measurement of free-form eye-glass lenses 8.7 D (1/m) 25.1 Eye-glass object Measured curvature Observed fringe Remove the lowfrequency structure 0.78µm 8039µm 0.78µm 8039µm Measured shape Micro-structure of shape The output data format could be binary, ASCII, STL, etc. User can do the data analysis by their own software. Figure 16: Measurement of free-form eye-glass lens with the desk-top type B. In the manufacturing process of the eye-glass lens, people must accurately control the surface topography to obtain the designed diopter and other requirements. In Figure 16, the absolute shape and the microstructures of top-surface of the eye-glass are exactly measured. From the output curvature map, we found that the lens’ diopter varies gradually in different place. In the center part of the surface there are some arc structures which should be the remaining trace of the surface polishing. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 14 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.5. Spherical lens mold (Aluminum, diamond turned) 81 mm a) (far) Mold object [80 nm] b) Height map (PV~ 11.8mm) (near) c) Microstructure in tangential direction (far) [350 nm] (near) d) Microstructure in radial direction Figure 17: Measurement of a diamond turned spherical lens mold with the desk-top type A. In this application we measured a diamond turned spherical lens mold. The dynamic range of the object in the height direction is very large (nearly 12mm), as shown in Figure 17b). After removing the low-frequency shape component, we found a lot of interesting structures in both tangential and radial directions, as shown in Figure 17c) and 17d), respectively. The chatter information from the high speed milling is presented in the microstructure in the tangential directions, while in the radial direction the circled tool traces are clearly visible. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 15 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.6. Measurement of milled / polished surface Silicon flat 40 mm Diamond milled silicon flat mirror The surface height map can be separated into different compositions: 1) Cutting trace by guidance vibration, 2) Tool oscillation by cutting force change at border entrance, 3) Remaining non-systematic machining traces 42 nm Height map Tool oscillation Cutting traces = + + 20nm 11nm Polishing wear 50 mm Remaining non-systematic machining traces 16nm Eye-glass polishing Object and polishing tool Curvature map after a short-time polishing. Measure the shape of polished surface and the volume of cut-out footprint. It is consistent with the WLI measurement. Curvature map after a long-time polishing. The number of holes increases towards larger radii where the cutting speed is too high. Figure 18: Measurement of milled / polished surface. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 16 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.7. Measurement of rivet holes on aircraft surface Surface cleaning Adjust instrument position Measuring This is the result of a measurement of the deformation around the rivet hole of an aircraft. Asymmetrical deformations can be seen in some places, with a range of about 50 μm. Figure 19: Measurement of aircraft surface with the mobile type A. The aircraft manufacturing company had already used the deflectometry system to measure the deformation around the rivet hole. Instead of directly measuring the internal flaws of the rivets, the system judges the fit of the rivets and the aircraft materials through the deformation around the rivet holes in the outer surface of the aircraft. The deformation around the rivet hole should be uniform in the normal situation. This is measured at the aircraft fatigue test site. By comparing measurements from every few months, the safety of rivets and materials can be evaluated. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 17 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.8. Lacquer surface – frequency separation Wa Wb Wc Wd Curvature map of a lacquer surface Figure 20: Measurement of lacquer surface. The lacquer surfaces, e.g. automobile, painted wood, etc., are very suited for quality control using deflectometry. The reflective properties of the surface are largely determined by the microstructure of the shape. Normally the microstructure will be separated into different scale ranges, for example, Wa (0.1~0.3mm), Wb (0.3~1.0mm), Wc (1.0~3.0mm), Wd (3.0~10.0mm), etc. The amplitude of height distribution in these ranges will indicate the reflective characters of the surface. Currently, the industry generally adopts one-dimensional photoelectric scanners to measure these parameters. By using deflectometry system, we get a two-dimensional distribution, e.g. curvature map, which can better describe the surface. As shown in Figure 20. In the meantime, the deflectometry system can also be used to detect other surface features, like defect, scratches, orange-peel, waviness, etc. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 18 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 8.9. Other Applications  Laser mirror (copper) 278 nm Laser mirror  Measurement fringe pattern Parabolic telescope mirror (glass,  = 200 mm) Parabolic mirror  Here is the height map after removing a polynomial. A deep groove is visible. Paraboloid fit residual f = 517.8 mm Liquid surface 526 µm Water surface deforms under the effect of surface tension. Here is a needle floating on the water. © Vereinigte ElektronikWerkstätten GmbH The measured height map of the water surface Author: Dr. Wansong Li Page 19 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 9 Development According to User Requirements As mentioned earlier, the measurement volume of the deflectometry system depends on the curvature of the measured object. We always design the geometrical parameters of measurement system and choose the most reasonable hardware configuration based on the user provided information, such as lateral dimensions and curvature radius of the object, surface reflection characteristics, the desired coordinates resolution and measurement accuracy, etc. For this purpose, we have developed aided design software that can accurately simulate the behavior of the measurement system in the case of different measured objects. At the same time, it can also calculate possible measurement error distributions based on noise patterns, positioning errors and other parameters. Figures 21~24 show the observed camera fringes reflected from different objects (plane, sphere, parabolic trough and hyperboloid) in an otherwise identical measurement set-up. With the simulation, the measurable range on different object surfaces is easy to check. By adjusting the system parameters, we can measure the surface of the object as large as possible. The simplest such adjustment is to change angles and distances between components, and if necessary, also use different kind of camera lens, CCD chips and the displays. a) b) c) Figure 21: Simulated fringes reflected by a plane (size 160x160 mm2, located at the reference plane). a) Set-up; b) and c) simulated camera fringe images in direction x (straight and vertical on the monitor) and y (straight and horizontal on the monitor), respectively. a) b) c) Figure 22: Simulated fringes reflected by a convex sphere (curvature radius R = 300 mm, 150mm). a) Set-up; b) and c) simulated camera fringe images in direction x and y, respectively. a) b) c) Figure 23: Simulated fringes reflected by a concave parabolic trough (focal length in y direction is 56.25 mm). a) Set-up; b) and c) simulated camera fringe images in direction x and y, respectively. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 20 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen a) b) c) Figure 24: Simulated fringes reflected by a concave hyperboloid (described by x2/(400 mm2) + y2/(900 mm2) – z2/(9 mm2) = –1). a) Set-up; b) and c) simulated camera fringe images in direction x and y, respectively. VEW had participated in the E-ELT project of European Southern Observatory (ESO). The main mirror M1 of the telescope has a diameter of 39m, and each segment of M1 is a hexagonal glass mirror whose lateral size is round about 1420mm. VEW had proposed a deflectometry system to characterise deformations of E-ELT mirror segments. According to our simulation, the accuracy of the deformation measurement can achieve to 50~100nm. The E-ELT telescope and our proposed deflectometry system are shown in Figure 25. The E-ELT is a very large telescope, consisting of 798 mirror elements. It is built in the Atacama desert. The E-ELT telescope Mirror segment Projection of the patterns with centrally arranged CCD camera Mirror segment to be measured, mounted on piezo actuators Ring with multiline-lasers that measure the exact distance to the projection surface Model of the proposed deflectometry system Over all dimension: 1:1 approx. 5m Figure 25: The deflectometry system for deformation measurement of the mirror segment of the E-ELT telescope. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 21 of 22 Pages Vereinigte Elektronikwerkstätten GmbH Bremen 10 Technical Specifications We take the desktop type B as an example. Device size 500×500×790mm Device weight ~30kg CCD camera 1) Network, USB or Fire-wire, 1392×1040 pixel TFT display 1) Display port, DVI, 410×310mm, 1600×1200 pixel 1~600s (according to expected resolution settings) Measurement time Lateral measurement range 110×80mm Surface normal variable range ~25º Lateral coordinate resolution 80µm Height coordinate resolution 2) ~1nm Curvature resolution 2) 0.05/m (curvature radius 20m) Full field measurement accuracy 2) Object positioning use laser pointer Plane: ~50nm Freeform surface: include an extra parabolic structure (PV~10µm) Object positioning use a high accuracy confocal sensor: Plane: ~50nm Freeform surface: 200 nm Local range accuracy ~1nm (microstructure and waviness) 2) Output Data Binary, ASCII, STL Measurement Software FringeProcessor 6.8, include user SDK. Environment temperature 0~30ºC Environment humidity 0~80% Laser class 2) Class 2 Note: 1) Configurable according to user requirement. 2) The resolution and accuracy here are for surfaces with good specular reflection. If the surface has a certain degree of diffuse reflection, multiple reflections, etc., its specifications will decline accordingly. © Vereinigte ElektronikWerkstätten GmbH Author: Dr. Wansong Li Page 22 of 22 Pages  
VEW 6DT1031 RED Reversing contactor step regulator  
Technical Data Supply voltage 380/400V AC; 3Ph Output rating 2,2kW Inputs, logic signal +24V-level; CW; CCW; (Stop) Switching frequency max. 1200/h Impulse length > 150ms Control voltage L1 220/230V AC 50Hz Input level DC +24V (H +15...+30V, L -2V...+4,5V) Output nom. 24V DC PM (16...30V) Output current 100mA, short circuit proof *All product and service marks contained herein are the trademarks or service marks of their respective owners. Product Information The original Siemens reversing contactor regulators are no longer available. Regarding connection, dimensions and functions, our newly developed and redesigned devices are fully compatible with the original, and can be installed/placed “plug-and-play” in the existing location. The modular units with 2.2 kW output rating are mounted in a ½-19-inch 3HE rack. For maintenance each of the contactors and relays are easily replacable. The construction is designed for natural convection cooling in a control cabinet with a 50% overload rating, and an ambient temperature of max. 60°C. The units work as a 3-phase reversing switch, for change of rotation and with an automatic brake (if installed) for stopping. The rotation direction of the connected AC actuator motor is determined by contactor reversed phase switching. Hereby, the respective rotation (CW and CCW) are indicated by signalling LEDs in the front panel. The logical input conditions for CW and CCW control are mutually locked. A signal change at only one of the logic inputs during operation does not cause a change in the actuators rotation direction. Interference pulses are suppressed. Depending on how the module has been configured by means of jumpers, the turn-off time between the positioning pulse is 200ms, to avoid a short circuit between the phases. When the actuators rotation direction is to be changed, the contactor turn-off times preceding and following the braking time are added to give a total time, after which the actuator is reversed. Furthermore, the control unit monitors phases U and W with lamp H1, the system voltage, and the actuator temperature. Each of the two monitors can trigger a corresponding alarm signal, which can be processed by an external superordinate system. On the frontplate: The test socket 1...4 to control or simulate stepper pulses, the glow lamp H1 to show actuator active, the LEDs ,,on‘‘ (green), direction ,,CW‘‘ (yellow) and ,,CCW‘‘ (yellow). Data sheet VEW 6DT1031 RED  
VEW 6DT1034 RED Reversing contactor step regulator  
Technical Data Supply voltage 380/400V AC; 3Ph Output rating 7,5kW Inputs, logic signal +24V-level; CW; CCW; (Stop) Brake Brake lifting magnet Switching frequency max. 1200/h Impulse length > 150ms Control voltage L1 220/230V AC 50Hz Input level DC +24V (H +15...+30V, L -2V...+4,5V) Output nom. 24V DC PM (16...30V) Output current 100mA, short circuit proof *All product and service marks contained herein are the trademarks or service marks of their respective owners. Product Information The original Siemens reversing contactor regulators are no longer available. Regarding pin dimensions and functions, our newly developed and redesigned devices are fully compatible with the original, and can be installed/replaced “plug-and-play” in the existing location. The modular units with 7,5 kW output rating are mounted in a ½-19-inch 3HE rack. The open-frame construction is designed for natural convection cooling in a control cabinet with a 50% overload rating, and an ambient temperature of max. 60°C. The units work as a 3-phase reversal switch with an automatic brake for stopping and change of rotation direction. The rotation direction of the connected AC actuator motor is determined by contactor reversed phase switching. Hereby, the respective rotation (CW and CCW) and actuation of the brake are indicated by signalling LEDs in the front panel. The automatic brake is triggered between every change of rotation direction and for stopping. The logical input conditions for CW and CCW control are mutually locked. A signal change at only one of the logic inputs during operation does not cause a change in the actuators rotation direction. Interference pulses are suppressed. Depending on how the module has been configured by means of jumpers, the turn-off time between the positioning pulse is 200ms, to avoid a short circuit between the phases. When the actuators rotation direction is to be changed, the contactor turn-off times preceding and following the braking time are added to give a total time, after which the actuator is reversed. Furthermore, the control unit monitors with lamp H1 phases L2 and L3, the system voltage, and the actuator temperature. Each of the three monitors can trigger a corresponding alarm signal, which can be processed by an external superordinate system. On the frontplate: The test socket 1...4 to control or simulate stepper pulses, the glow lamp H1 to show actuator active, the LEDs ,,on‘‘ (green), direction ,,CW‘‘ and ,,CCW‘‘ (yellow), ,,brake‘‘ active (red), the overload circuit F1. Data sheet VEW 6DT1034 RED  
VEW E44010-A5700 L02C RED  
Technical data ] PCB-card 100x160mm Frontplate 9TE 3HE, Siemens, with handle Plug-in DIN 41612 24F + 7H, z+b+d Supply voltage nom. 24 DC, min. 10V DC, max. 35V DC Power max. 30VA Efficiency ca. 85% Temperature range -40... +85°C, derating from 60°C Output 15V DC; 2A, galvanic separate to UE Controls/control output UE < UE min; UA < UA soll; UA > UA soll; IA > IA max with memory function Remote input UA off *All product and service marks contained herein are the trademarks or service marks of their respective owners. Product Information Requirements have been made tougher for electrical and electronic equipment in public transit vehicles in terms of life, reliability, freedom from faults, long-term operations and availability. This power supply as a redesign of the original Siemens module meets or exceeds the fundamental standards (EN 60950, Ul60950). The devices are made to be a pin compatible and functionally compatible replacement for the Siemens DC/DC converter E44010 A5700 L02 CIt has a modular structure. The input modules for galvanically separating the input/output voltage are designed for a nominal 24 DC currentSeparation voltage UE//UA 1500V. The working ranges of the DC/DC converter modules range from 16V to 36V and the modules are also equipped with active transient protection, which safely eliminates the specified overvoltage (for 20mS) of two times the nominal input voltage of up to 48V and transients of up to 1000V//50µs. The module has diverse voltage and current monitoring circuits which are set to low levels at the binary outlets if: the input voltage is <UE min or the output voltage is > IA the output voltage < or > UA planned, the light diode will extinguish on the front plate the load current exceeds the maximum value 2A, or the input voltage fails to reachthe UE value, the status shall be stored and issued via a binary outlet. The MTBF of the DC/DC-converter module is > 350,000 h, which meets the life requirements for railway equipment of 24/d for 30a. The 19” 3HE insert meets the requirements for vehicle applications and is extremely robust and can resist a vibration load on three axels with and amplitude of 7.5mm at 5-150Hz and acceleration of 20m/s². Data sheet VEW E44010-A5700 L02C RED  
VEW 3SE.429.903.9012.02 / 03 RED  
VEW 3SE.429.903.9012.02 / 03 RED Technical data Supply 24V DC Power consumption approx. 80mA Inputs 2 LWL1000, IGBT-control Outputs 1 LWL1000, UCE and undervoltage detection 2 IGBT-surface contacts Type open frame, 120 x 85mm, FR4 epoxy, lackered *All product and service marks contained herein are the trademarks or service marks of their respective owners. Product Information The redesign of control module for IGBTs from the original manufacturer Siemens is available in 2 different assembly variants, which differ in the slightly different timing of the control of the externally arranged, parallel-connected IGBTs. The control connections of the IGBTs are supplied via two screwed flat contacts, which are connected to the control module via a pre-assembled, pluggable, 4-pin connection cable. This connection to the IGBTs, which can be separated using locked plug connectors, has the advantage of being able to exchange the control assembly without having to remove the entire IGBT assembly from the vehicle. The redesign can be used in place of the original Siemens assembly in a fully electrical and assembly-compatible manner. The control signals for the control module are fed redundantly to the photo receivers of the module via two LWL1000. This ensures galvanic isolation on the one hand and high immunity to interference on the other. The control module also has an active LWL1000 output for feedback from the UCE monitoring of the IGBTs and undervoltage detection. An active overvoltage protection device is implemented, which can reliably protect the IGBTs from destructive overvoltages from approx. 960V. The assemblies are supplied with an individual test report and a declaration of conformity in accordance with DIN EN 50155. Data sheet